دانلود هندبوک خصوصیات مواد ASM Handbook Volume 10 Materials Characterization 2019
خرید ایبوک Materials Characterization 2019 از هندبوک 10 از ASM
برای دانلود کتاب Materials Characterization نسخه دهم از مجموعه هندبوکهای ASM بر روی کلید خرید در انتهای صفحه کلیک کنید. پس از اتصال به درگاه پرداخت و تکمیل مراحل خرید، لینک دانلود هندبوک خصوصیات مواد 2019 ایمیل می شود. این کتاب در قالب PDF کلیه فصول بصورت مجزا ارسال می شود. ایبوک به زبان انگلیسی و به محض پرداخت هزینه فایلهای PDF کل 58 فصل در قالب یک فایل rar ارسال می شود.
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خرید کتاب ASM هندبوک جلد ۱۰ ویژگی های مواد
ASM Handbook, Volume 10: Materials Characterization
by Thomas J. Bruno (Editor), Ryan Deacon (Editor), Jeffrey A. Jansen (Editor), Neal Magdefrau (Editor), Erik Mueller (Editor), George F. Vander Voort (Editor), Dehua Yang (Editor)
Publisher : A S M International (30 May 2020)
Language : English
Hardcover : 800 pages
ISBN-10 : 1627082115
ISBN-13 : 978-1627082112
Send email to download :
Price : 15$
https://dl.asminternational.org/handbooks/book/100/Materials-Characterization
دانلود رایگان کتاب ASM Handbook, Volume 10: Materials Characterization
The 2019 edition of ASM Handbook, Volume 10: Materials Characterization provides detailed technical information that will enable readers to select and use analytical techniques that are appropriate for their problem. Each article describing a characterization technique begins with an overview of the method in simplified terms and lists common applications as well as limitations. Sample size, form, and special preparation requirements are listed upfront to help readers quickly decide if the techniques are appropriate to solve their problem. Tables and charts listing the most common characterization methods for different classes of materials are included in the beginning of the handbook. The tables give information on whether the technique is suitable for elemental analysis, qualitative analysis, surface analysis, or alloy verification. The articles also describe material characterization in general terms according to material type and serve as a jumping off point to the more specific technique articles. For information on the print version of Volume 10, ISBN 978-1-62708-211-2
دانلود ایبوک هندبوک خصوصیات مواد ASM Handbook 10
نسخه 2019 کتاب راهنمای ASM، جلد 10: مشخصات مواد، اطلاعات فنی دقیقی را ارائه میکند که خوانندگان را قادر میسازد تا تکنیکهای تحلیلی مناسب برای مشکل خود را انتخاب و استفاده کنند. هر مقاله ای که یک تکنیک خصوصیات را توصیف می کند، با مروری بر روش به زبان ساده شروع می شود و کاربردهای رایج و همچنین محدودیت ها را فهرست می کند. اندازه نمونه، فرم، و الزامات آماده سازی ویژه از قبل فهرست شده است تا به خوانندگان کمک کند تا سریعا تصمیم بگیرند که آیا تکنیک ها برای حل مشکل آنها مناسب است یا خیر. جداول و نمودارهایی که متداولترین روشهای مشخصسازی برای کلاسهای مختلف مواد را فهرست میکنند، در ابتدای کتاب راهنما گنجانده شدهاند. جداول اطلاعاتی در مورد اینکه آیا این تکنیک برای آنالیز عنصری، آنالیز کیفی، آنالیز سطحی یا تأیید آلیاژ مناسب است، ارائه می دهد. مقالات همچنین توصیف مواد را به طور کلی با توجه به نوع مواد توصیف می کنند و به عنوان نقطه پرش به مقالات تکنیک خاص تر عمل می کنند. برای اطلاع از نسخه چاپی جلد 10، شابک 978-1-62708-211-2
فهرست مطالب هندبوک ASM: دوره 10: خصوصیات مواد
Table of Contents
Publication History
Foreword
Preface
Credits
Introduction to Material Analysis Methods
Introduction to Materials Characterization
Doi: https://doi.org/10.31399/asm.hb.v10.a0006669
Published: 15 December 2019
Abstract
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Introduction to Characterization of Metals
Doi: https://doi.org/10.31399/asm.hb.v10.a0006678
Published: 15 December 2019
Abstract
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Semiconductor Characterization
David T. Schoen; Meredith S. Nevius; Sumit Chaudhary
Doi: https://doi.org/10.31399/asm.hb.v10.a0006670
Published: 15 December 2019
Abstract
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Characterization of Ceramics and Glasses
Doi: https://doi.org/10.31399/asm.hb.v10.a0006671
Published: 15 December 2019
Abstract
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Introduction to Characterization of Organic Solids and Organic Liquids
Richard Rucker
Doi: https://doi.org/10.31399/asm.hb.v10.a0006652
Published: 15 December 2019
Abstract
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Introduction to Characterization of Powders
Bo Hu
Doi: https://doi.org/10.31399/asm.hb.v10.a0006649
Published: 15 December 2019
Abstract
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Spectroscopy
Optical Emission Spectroscopy
Arne Bengtson
Doi: https://doi.org/10.31399/asm.hb.v10.a0006640
Published: 15 December 2019
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Atomic Absorption Spectroscopy
Gary D. Rayson
Doi: https://doi.org/10.31399/asm.hb.v10.a0006653
Published: 15 December 2019
Abstract
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Inductively Coupled Plasma Optical Emission Spectroscopy
Oumaïma Gharbi; Odile Hirsch; Patrick Chapon; Alice Stankova
Doi: https://doi.org/10.31399/asm.hb.v10.a0006647
Published: 15 December 2019
Abstract
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Infrared Spectroscopy
Curtis Marcott
Doi: https://doi.org/10.31399/asm.hb.v10.a0006662
Published: 15 December 2019
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Raman Spectroscopy
Doi: https://doi.org/10.31399/asm.hb.v10.a0006685
Published: 15 December 2019
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Nuclear Magnetic Resonance
Randall E. Youngman
Doi: https://doi.org/10.31399/asm.hb.v10.a0006650
Published: 15 December 2019
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Mass and Ion Spectrometry
Solid Analysis by Mass Spectrometry
Jessica Román-Kustas; Raymond S. Fuentes; Curtis D. Mowry
Doi: https://doi.org/10.31399/asm.hb.v10.a0006651
Published: 15 December 2019
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Gas Analysis by Mass Spectrometry
Curtis D. Mowry; Russell L. Jarek; Jessica Román-Kustas; Amber C. Telles; Adam S. Pimentel
Doi: https://doi.org/10.31399/asm.hb.v10.a0006663
Published: 15 December 2019
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Glow Discharge Mass Spectrometry
Cristina Gonzalez-Gago; Nerea Bordel; Jorge Pisonero
Doi: https://doi.org/10.31399/asm.hb.v10.a0006648
Published: 15 December 2019
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Inductively Coupled Plasma Mass Spectrometry
Fuhe Li; Hugh E. Gotts
Doi: https://doi.org/10.31399/asm.hb.v10.a0006641
Published: 15 December 2019
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Rutherford Backscattering Spectrometry
Lin Shao; Wei-Kan Chu
Doi: https://doi.org/10.31399/asm.hb.v10.a0006637
Published: 15 December 2019
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Low-Energy Ion-Scattering Spectroscopy
Kenji Umezawa
Doi: https://doi.org/10.31399/asm.hb.v10.a0006628
Published: 15 December 2019
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Chemical Analysis and Separation Techniques
Calibration and Experimental Uncertainty
Thomas J. Bruno
Doi: https://doi.org/10.31399/asm.hb.v10.a0006634
Published: 15 December 2019
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Chemical Spot Tests and Presumptive Tests
April A. Hill
Doi: https://doi.org/10.31399/asm.hb.v10.a0006635
Published: 15 December 2019
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Classical Wet Analytical Chemistry
Lisa S. Ott
Doi: https://doi.org/10.31399/asm.hb.v10.a0006629
Published: 15 December 2019
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Gas Chromatography
Tara M. Lovestead
Doi: https://doi.org/10.31399/asm.hb.v10.a0006659
Published: 15 December 2019
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Gas Chromatography/Mass Spectrometry
Tara M. Lovestead; Kimberly N. Urness
Doi: https://doi.org/10.31399/asm.hb.v10.a0006664
Published: 15 December 2019
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Liquid Chromatography
Kavita M. Jeerage; Gregory P. Dooley
Doi: https://doi.org/10.31399/asm.hb.v10.a0006636
Published: 15 December 2019
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Ion Chromatography
Christopher A. Pohl
Doi: https://doi.org/10.31399/asm.hb.v10.a0006630
Published: 15 December 2019
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Electrochemical Methods
Paris Svoronos
Doi: https://doi.org/10.31399/asm.hb.v10.a0006679
Published: 15 December 2019
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Neutron Activation Analysis
Bryan E. Tomlin
Doi: https://doi.org/10.31399/asm.hb.v10.a0006642
Published: 15 December 2019
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Thermal Analysis
Differential Scanning Calorimetry
Victoria Burt
Doi: https://doi.org/10.31399/asm.hb.v10.a0006672
Published: 15 December 2019
Abstract
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Thermogravimetric Analysis
Doi: https://doi.org/10.31399/asm.hb.v10.a0006673
Published: 15 December 2019
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Dynamic Mechanical Analysis
Victoria Burt
Doi: https://doi.org/10.31399/asm.hb.v10.a0006676
Published: 15 December 2019
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Thermomechanical Analysis
Richard E. Chinn
Doi: https://doi.org/10.31399/asm.hb.v10.a0006674
Published: 15 December 2019
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X-Ray Analysis
X-Ray Spectroscopy
S. Lampman
Doi: https://doi.org/10.31399/asm.hb.v10.a0006645
Published: 15 December 2019
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Extended X-Ray Absorption Fine Structure
Doi: https://doi.org/10.31399/asm.hb.v10.a0006665
Published: 15 December 2019
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Particle-Induced X-Ray Emission
Doi: https://doi.org/10.31399/asm.hb.v10.a0006666
Published: 15 December 2019
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Mössbauer Spectroscopy
Doi: https://doi.org/10.31399/asm.hb.v10.a0006646
Published: 15 December 2019
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X-Ray and Neutron Diffraction
Introduction to Diffraction Methods
Matteo Leoni
Doi: https://doi.org/10.31399/asm.hb.v10.a0006643
Published: 15 December 2019
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X-Ray Powder Diffraction
Matteo Leoni
Doi: https://doi.org/10.31399/asm.hb.v10.a0006680
Published: 15 December 2019
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Single-Crystal X-Ray Diffraction
Vladislav V. Gurzhiy
Doi: https://doi.org/10.31399/asm.hb.v10.a0006631
Published: 15 December 2019
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Micro X-Ray Diffraction
Thomas N. Blanton; Gregory Schmidt
Doi: https://doi.org/10.31399/asm.hb.v10.a0006656
Published: 15 December 2019
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X-Ray Diffraction Residual-Stress Techniques
Paul S. Prevéy; Douglas J. Hornbach
Doi: https://doi.org/10.31399/asm.hb.v10.a0006632
Published: 15 December 2019
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X-Ray Topography
Balaji Raghothamachar; Michael Dudley
Doi: https://doi.org/10.31399/asm.hb.v10.a0006644
Published: 15 December 2019
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Synchrotron X-Ray Diffraction Applications
Wenqian Xu; Saul H. Lapidus; Andrey Y. Yakovenko; Youngchang Kim; Olaf J. Borkiewicz; Kamila M. Wiaderek; Yu-Sheng Chen; Tiffany L. Kinnibrugh
Doi: https://doi.org/10.31399/asm.hb.v10.a0006654
Published: 15 December 2019
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Neutron Diffraction
António M. dos Santos; Melanie Kirkham; Christina Hoffmann
Doi: https://doi.org/10.31399/asm.hb.v10.a0006667
Published: 15 December 2019
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Light Optical Micrography
Light Optical Metallography
George F. Vander Voort
Doi: https://doi.org/10.31399/asm.hb.v10.a0006684
Published: 15 December 2019
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Quantitative Metallography
George F. Vander Voort
Doi: https://doi.org/10.31399/asm.hb.v10.a0006682
Published: 15 December 2019
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Microscopy and Microanalysis
Scanning Electron Microscopy
Yoosuf N. Picard
Doi: https://doi.org/10.31399/asm.hb.v10.a0006668
Published: 15 December 2019
Abstract
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Crystallographic Analysis by Electron Backscatter Diffraction in the Scanning Electron Microscope
Joseph R. Michael
Doi: https://doi.org/10.31399/asm.hb.v10.a0006660
Published: 15 December 2019
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Transmission Electron Microscopy
Masashi Watanabe
Doi: https://doi.org/10.31399/asm.hb.v10.a0006681
Published: 15 December 2019
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Electron Probe X-Ray Microanalysis
Dale E. Newbury; Nicholas W. M. Ritchie
Doi: https://doi.org/10.31399/asm.hb.v10.a0006638
Published: 15 December 2019
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Focused Ion Beam Instruments
Nabil Bassim; John Notte
Doi: https://doi.org/10.31399/asm.hb.v10.a0006677
Published: 15 December 2019
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Surface Analysis
Introduction to Surface Analysis
Dehua Yang
Doi: https://doi.org/10.31399/asm.hb.v10.a0006675
Published: 15 December 2019
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Auger Electron Spectroscopy
A. Joshi; D.F. Paul
Doi: https://doi.org/10.31399/asm.hb.v10.a0006657
Published: 15 December 2019
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Low-Energy Electron Diffraction
Amirali Zangiabadi
Doi: https://doi.org/10.31399/asm.hb.v10.a0006655
Published: 15 December 2019
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Introduction to Scanning Probe Microscopy
Bharat Bhushan
Doi: https://doi.org/10.31399/asm.hb.v10.a0006633
Published: 15 December 2019
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Atomic Force Microscopy
Paul West
Doi: https://doi.org/10.31399/asm.hb.v10.a0006658
Published: 15 December 2019
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Secondary Ion Mass Spectroscopy
Doi: https://doi.org/10.31399/asm.hb.v10.a0006683
Published: 15 December 2019
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X-Ray Photoelectron Spectroscopy
Binayak Panda
Doi: https://doi.org/10.31399/asm.hb.v10.a0006639
Published: 15 December 2019
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Thermal Desorption Spectroscopy
Gary L. Doll; Paul J. Shiller
Doi: https://doi.org/10.31399/asm.hb.v10.a0006661
Published: 15 December 2019
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Reference Information
Glossary of Terms: Materials Characterization
Doi: https://doi.org/10.31399/asm.hb.v10.a0006748
Published: 15 December 2019